G01R31/308- Contactless testing using non-ionising electromagnetic radiation, e.g.G01R31/28- Testing of electronic circuits, e.g.G01R31/00- Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere.G01R- MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES.Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Priority claimed from US10/814,962 external-priority Application filed by International Business Machines Corp filed Critical International Business Machines Corp Publication of CN1677120A publication Critical patent/CN1677120A/en Status Pending legal-status Critical Current Links Original Assignee International Business Machines Corp Priority date (The priority date is an assumption and is not a legal conclusion. ![]() Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) 韦格 Current Assignee (The listed assignees may be inaccurate.Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Pending Application number CNA2005100598247A Other languages Chinese ( zh) Google Patents Method, system and device for operating PICA (picosecond imaging circuit analysis)/high current source systemĭownload PDF Info Publication number CN1677120A CN1677120A CNA2005100598247A CN200510059824A CN1677120A CN 1677120 A CN1677120 A CN 1677120A CN A2005100598247 A CNA2005100598247 A CN A2005100598247A CN 200510059824 A CN200510059824 A CN 200510059824A CN 1677120 A CN1677120 A CN 1677120A Authority CN China Prior art keywords pulse current source photo emissions voltage Prior art date Legal status (The legal status is an assumption and is not a legal conclusion. Google Patents CN1677120A - Method, system and device for operating PICA (picosecond imaging circuit analysis)/high current source system CN1677120A - Method, system and device for operating PICA (picosecond imaging circuit analysis)/high current source system
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